Available irradiation conditions for LIDT testing

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all available Lidt irradiation conditions

Polarization state for all conditions⁵: Circular/Linear (S,P); available AOI: 0-75⁶ deg.

All
CW (LIDT)
Low-loss absorption
NS (LIDT)
PS-FS (LIDT)

Wavelengths, nm:

Pulse range	Laser	Effective pulse duration⁽¹⁾	Wavelengths, nm	Pulse repetition rate, Hz	Available Tests
CW	Ytterbium (Yb) Fiber Laser	Tunable 1 ms – 30 s^{(2, 4)}	1070	Single shot or < 500 Hz	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test
CW	Ytterbium (Yb) Fiber Laser	N/A	1070	N/A	Show available tests PCI absorptance testing of dielectric coatings
q-CW	Custom active medium	>20 ps	532	multi-MHz	Show available tests PCI absorptance testing of dielectric coatings
q-CW	Nd:YVO₄	10 ps	1064 532 355 266	1000000	Show available tests PCI absorptance testing of dielectric coatings
NS	Nd:YAG (single- and multi-mode)	10 ns 5 ns 5 ns 5 ns	1064 532 355 266	1-100	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test
NS	Nd:YAG OPO (single mode)	~4 ns	710-810 1500-2100	1-100⁽³⁾	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test
PS-FS	Yb:KGW (Kerr lens mode-lock)	135 ps at 1030 nm Tunable: 190 fs – 12 ps⁽³⁾	1030 515 343 258	Tunable: 1-1000000⁽³⁾	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test “Classical” Lifetime Test (ps, fs @ kHz) Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test “Classical” Lifetime Test (ps, fs @ kHz) Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test “Classical” Lifetime Test (ps, fs @ kHz) Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test “Classical” Lifetime Test (ps, fs @ kHz)
PS-FS	Ti:Sapphire (Kerr lens mode-lock)	135 ps at 800 nm Tunable: 65 fs – 5 ps⁽³⁾ 65 fs – 1 ps	800 400	Tunable: 10, 100, 1000	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test

Effective pulse duration measured at Full Width Half Maximum.
Longer exposure times are available on demand.
Maximum energy and pulse duration depend on the selected wavelength.
Limited due to safety reasons by 1kW of average power (for higher powers 1s is used by default): longer pulse durations are available on demand.
At the CW regime currently only: 1) random polarization is available 2) the smallest available AOI is 12deg.
Availability to test up to 75 deg. AOI depends on the specific system and sample geometry.

environmental conditions

Testing environment	Specifications	Available tests
Air: clean room environment	Room temperature	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3) R-on-1 LIDT test Raster scan LIDT test “Classical” Lifetime Test (ps, fs @ kHz) PCI absorptance testing of dielectric coatings
Vacuum	Down to 10^-6 mbar	Show available tests ISO 1-on-1 LIDT test (21254-1,2) ISO S-on-1 LIDT test (21254-1,2) ISO LIDT Certification Test (21254-1,3)

Standard testing conditions

Standard samples: 1- or 2-inch round samples.

Standard testing regimes:

Nanosecond (NS): 1064 nm, 532 nm, 355 nm, 266 nm.

Femtosecond (FS): 1030 nm, 515 nm, 343 nm.

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